JPS5931459A - プリント配線板の検査方法及びその検査装置 - Google Patents
プリント配線板の検査方法及びその検査装置Info
- Publication number
- JPS5931459A JPS5931459A JP57052642A JP5264282A JPS5931459A JP S5931459 A JPS5931459 A JP S5931459A JP 57052642 A JP57052642 A JP 57052642A JP 5264282 A JP5264282 A JP 5264282A JP S5931459 A JPS5931459 A JP S5931459A
- Authority
- JP
- Japan
- Prior art keywords
- circuit board
- inspection
- board
- printed circuit
- pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims description 15
- 238000007689 inspection Methods 0.000 claims abstract description 31
- 238000012360 testing method Methods 0.000 claims description 12
- 238000001514 detection method Methods 0.000 claims description 5
- 230000006378 damage Effects 0.000 claims 1
- 210000004907 gland Anatomy 0.000 claims 1
- 239000000523 sample Substances 0.000 description 7
- 238000000605 extraction Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- IRUJZVNXZWPBMU-UHFFFAOYSA-N cartap Chemical compound NC(=O)SCC(N(C)C)CSC(N)=O IRUJZVNXZWPBMU-UHFFFAOYSA-N 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 210000001217 buttock Anatomy 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000004575 stone Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2805—Bare printed circuit boards
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57052642A JPS5931459A (ja) | 1982-03-30 | 1982-03-30 | プリント配線板の検査方法及びその検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57052642A JPS5931459A (ja) | 1982-03-30 | 1982-03-30 | プリント配線板の検査方法及びその検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5931459A true JPS5931459A (ja) | 1984-02-20 |
JPH0244035B2 JPH0244035B2 (en]) | 1990-10-02 |
Family
ID=12920486
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57052642A Granted JPS5931459A (ja) | 1982-03-30 | 1982-03-30 | プリント配線板の検査方法及びその検査装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5931459A (en]) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01102377A (ja) * | 1987-10-16 | 1989-04-20 | Daiwa Seiko Kk | プリント回路基板の検査方法及びその装着並びに検査治具 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5429053A (en) * | 1977-08-08 | 1979-03-03 | Nippon Electric Co | Inspecting apparatus for print substrate pattern |
JPS54156760U (en]) * | 1978-04-25 | 1979-10-31 |
-
1982
- 1982-03-30 JP JP57052642A patent/JPS5931459A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5429053A (en) * | 1977-08-08 | 1979-03-03 | Nippon Electric Co | Inspecting apparatus for print substrate pattern |
JPS54156760U (en]) * | 1978-04-25 | 1979-10-31 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01102377A (ja) * | 1987-10-16 | 1989-04-20 | Daiwa Seiko Kk | プリント回路基板の検査方法及びその装着並びに検査治具 |
Also Published As
Publication number | Publication date |
---|---|
JPH0244035B2 (en]) | 1990-10-02 |
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