JPS5931459A - プリント配線板の検査方法及びその検査装置 - Google Patents

プリント配線板の検査方法及びその検査装置

Info

Publication number
JPS5931459A
JPS5931459A JP57052642A JP5264282A JPS5931459A JP S5931459 A JPS5931459 A JP S5931459A JP 57052642 A JP57052642 A JP 57052642A JP 5264282 A JP5264282 A JP 5264282A JP S5931459 A JPS5931459 A JP S5931459A
Authority
JP
Japan
Prior art keywords
circuit board
inspection
board
printed circuit
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57052642A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0244035B2 (en]
Inventor
Kazumasa Adachi
足立 和正
Tatsuo Nakahara
中原 辰夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ibiden Co Ltd
Original Assignee
Ibiden Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibiden Co Ltd filed Critical Ibiden Co Ltd
Priority to JP57052642A priority Critical patent/JPS5931459A/ja
Publication of JPS5931459A publication Critical patent/JPS5931459A/ja
Publication of JPH0244035B2 publication Critical patent/JPH0244035B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805Bare printed circuit boards

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP57052642A 1982-03-30 1982-03-30 プリント配線板の検査方法及びその検査装置 Granted JPS5931459A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57052642A JPS5931459A (ja) 1982-03-30 1982-03-30 プリント配線板の検査方法及びその検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57052642A JPS5931459A (ja) 1982-03-30 1982-03-30 プリント配線板の検査方法及びその検査装置

Publications (2)

Publication Number Publication Date
JPS5931459A true JPS5931459A (ja) 1984-02-20
JPH0244035B2 JPH0244035B2 (en]) 1990-10-02

Family

ID=12920486

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57052642A Granted JPS5931459A (ja) 1982-03-30 1982-03-30 プリント配線板の検査方法及びその検査装置

Country Status (1)

Country Link
JP (1) JPS5931459A (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01102377A (ja) * 1987-10-16 1989-04-20 Daiwa Seiko Kk プリント回路基板の検査方法及びその装着並びに検査治具

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5429053A (en) * 1977-08-08 1979-03-03 Nippon Electric Co Inspecting apparatus for print substrate pattern
JPS54156760U (en]) * 1978-04-25 1979-10-31

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5429053A (en) * 1977-08-08 1979-03-03 Nippon Electric Co Inspecting apparatus for print substrate pattern
JPS54156760U (en]) * 1978-04-25 1979-10-31

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01102377A (ja) * 1987-10-16 1989-04-20 Daiwa Seiko Kk プリント回路基板の検査方法及びその装着並びに検査治具

Also Published As

Publication number Publication date
JPH0244035B2 (en]) 1990-10-02

Similar Documents

Publication Publication Date Title
TW366423B (en) Adapter arrangement for electrically testing printed circuit boards
MY113351A (en) Testing fixture and method for circuit traces on a flexible substrate
TW200639411A (en) Resilient probes for electrical testing
JPS5745473A (en) Device and method for testing printed circuit board
SG129234A1 (en) Adapter method and apparatus for interfacing a tester with a device under test
JP2008102070A (ja) 電子部品検査プローブ
JPS601574A (ja) プリント配線板検査用治具回路板
JPS5931459A (ja) プリント配線板の検査方法及びその検査装置
EP0846953A3 (en) Printed circuit board inspecting apparatus, and method of using a universal-type printed circuit board inspecting apparatus
JP2001066351A (ja) 回路基板検査装置及びコネクタ
KR100765490B1 (ko) Pcb 전극판
KR100737384B1 (ko) 모바일용 디스플레이 패널의 검사장치 및 방법
KR20190097761A (ko) 모바일 디스플레이 패널의 모듈 검사장치 및 검사방법
US4328264A (en) Method for making apparatus for testing traces on a printed circuit board substrate
DE60107881D1 (de) Vorrichtung und verfahren zur prüfung von unbestückten gedruckten schaltungen
JPS59206776A (ja) プリント配線板の検査装置
TW200716994A (en) Circuit board inspecting apparatus and circuit board inspecting method
TW504575B (en) Copper electric type test fixture for circuit board
KR200417528Y1 (ko) Pcb 전극판
JPS59228174A (ja) プリント配線板検査用治具回路板
WO2006104886A3 (en) Resilient probes for electrical testing
KR100685223B1 (ko) 인쇄회로기판의 검사방법
JPH0143652Y2 (en])
JPH0611462Y2 (ja) 基板検査用コンタクトプローブ
JP2004039729A (ja) プリント配線基板の検査治具